Michail N. Philippov
Michail N. Philippov

Michail N. Philippov

Position:
Professor
Academic qualifications:
Doctor of science

Educational activity at the Department

  • Prepared course "Methods and instruments for research, analysis and diagnosis of nanoparticles and nanomaterials" and lectured 5th year students of specialty "nanomaterials".

Scientific interests

  • methods of local analysis and surface analysis;
  • X-ray analysis;
  • scanning electron microscopy;
  • metrology;
  • theory of interaction of non-relativistic electron beams with solids.

Publications

  1. A.Y. Kuzin, V.M. Lahov, Yu.A. Novikov, A.V. Rakov, P.A. Todua, M.N. Filippov. Russian standards for measuring the linear dimensions of nanotechnology. Nanotechnology. 2009. # 3. - p. 2-5.
  2. M.N. Filippov, T.A. Kupriyanov, O.I. Lyamina, E.V. Fatyushina. New X-ray and mass spectral methods of chemical analysis and diagnostic substances and materials. Current problems in general and inorganic chemistry. // Nauka. 2009. p. 402-420.
  3. Larionov Yu.V., Mityuhdyaev V.B., Filippov M.N. The effect of contamination of samples in the SEM on the measurement of linear dimensions. // Surface. X-ray, synchrotron and neutron research. 2008. # 9. - p. 53-64.
  4. Filippov M.N. Evaluation of the thermal effects of the electron probe in scanning electron microscopy and X-ray microanalysis // Izvestiya A.N. Physical series. 1993. Vol. 57. # 8. p. 165-171.
  5. Filippov M.N., Mukhanov A.A., Kupriyanov T.A., Lyamina O.I. Using X-ray counterparts of determined elements in X-ray fluorescence analysis of liquid samples // Journal of Analytical Chemistry, 2008, Vol. 63, # 8, p. 830-835.
  6. Larionov Yu.V., Mityuhlyaev V.B., Filippov M.N. The effect of contamination of samples in the SEM on the measurement of linear dimensions. // Surface. X-ray, synchrotron and neutron research. 2008. # 9. p. 53-64.

Background and professional experience

  • Graduated from Moscow State University named after M.V. Lomonosov, Physics Department in 1978, specialty - "Physics", qualification - "physicist."

Additional information

  • Expert for Standardization (certificate SE N0000124, registered in the register of experts on standardization of protocol # 8, January 26, 2007), writer-developer of six national standards of the Russian Federation in the field of metrology of linear measurements in the nanometer range.
  • Member of the Scientific Council (NSAH RAS) on Analytical Chemistry, a member of the Bureau NSAH Academy of Sciences, chairman of the RAS NSAH nano analysis.
  • Member of the Scientific Council on the chemistry of high-purity substances, the head of the working group "Diagnostics of materials based on high-purity substances".
  • Professor, Department of Certification and analytical control of "MISIS".

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Phone:  (495) 236-42-77

E-mail: e-mail
Updated:  February 2011

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